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Two experiments connect altermagnet identification with a possible control mechanism

SLAC-led X-ray measurements and Oak Ridge neutron studies address different obstacles on the path toward spin-based electronics.

Conceptual illustration of an electronic wafer and luminous pathways
AI-generated illustration. AI-generated conceptual illustration; not a photograph of the people, equipment or incident described.

Recent national-laboratory studies advance two separate questions for altermagnetic materials: how to identify their distinctive magnetic behavior, and how to change it. The findings concern laboratory measurements, not a newly available memory chip.

A SLAC-led team studied manganese telluride using circularly polarized X-rays at the European Synchrotron Radiation Facility. Different responses to opposite polarizations revealed a chiral signature that the researchers identify as evidence for altermagnetism. SLAC’s October 29 account says the initial 2024 experiment was repeated in early 2025. The study appeared in Science.

Altermagnets combine opposing spin arrangements with a crystal symmetry different from conventional antiferromagnets. The attraction for electronics is the prospect of useful spin-polarized currents without overall magnetization. Practical control remains a research objective.

In separate work described October 27, Oak Ridge researchers compressed manganese telluride and iron sulfide crystals between titanium plates. Neutron diffraction showed changes in magnetic-domain populations; the work also identified changes in the anomalous Hall response. The studies appeared in Physical Review X and Advanced Materials.

NAOAT analysis

Read together, the experiments connect a classification problem with an engineering question. Establishing that a material has an unusual magnetic state gives researchers a target. Showing that strain changes its behavior offers a possible means of adjustment. Neither result alone establishes that a device can switch repeatedly, retain information or tolerate manufacturing variation.

For the semiconductor supply chain, the relevant milestone is therefore a stronger experimental foundation. Translating that foundation into a component would require a controlled fabrication route and measured device performance. The two reports should not be collapsed into a claim that faster or lower-power commercial computers have already been demonstrated.